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A dedicated and versatile system for testing the radiation hardness of various integrated circuits

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Published 24 January 2023 © 2023 The Author(s). Published by IOP Publishing Ltd on behalf of Sissa Medialab.
, , Citation V.M. Placinta et al 2023 JINST 18 C01053 DOI 10.1088/1748-0221/18/01/C01053

1748-0221/18/01/C01053

Abstract

This work describes the architecture of a versatile system that is dedicated to the testing of various integrated circuits in radiation (e.g., ASICs, FPGAs). The system powers the device under test remotely. It monitors and reads out in real time various parameters, like: power consumption, voltage and current (with resolution of 100 µV and 100 µA, respectively), specific operational parameters of the device under test and its package temperature. A key feature of this system is its multi-channel and remote power supply capabilities, used to power the device under test. It embeds built-in features to detect and record single-event latch-ups, single event upsets and to monitor total ionizing dose cumulative effects. A graphical user interface allows the user to connect and to control the entire system through a dedicated ethernet interface from a safe location zone, and record to disk measurements data.

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10.1088/1748-0221/18/01/C01053